Laboratory Instruments

TOF.SIMS 5 ( Time OF Flight SIMS) - ION TOF
Superior Performance for all SIMS Applications

The TOF.SIMS 5 provides detailed elemental and molecular information about surface, thin layers, interfaces of the sample, and gives a full three-dimensional analysis. Its unique design guarantees optimum performance in all fields of SIMS applications.

Scanning Acoustic Microscopy - KSI (Kraemer Sonic Industries)

The v-400 is the all-rounder within the KSI product line. With the easy and intuitive to use graphical interface the v-400 is the problem solver par excellence. Brilliant image quality together with extreme high scan speed make it applicable for lab and production line. The modular configuration concept allows a excellent price performance ratio. The v-400 is also as an multi-channel system available. It can be equipped with up to 8 channels.


Surface Profiler- KLA Tencor


The P-16+ stylus profiler is a surface metrology analysis solution used in a wide range of applications and industries, from R&D departments and universities to production and process monitoring. The surface metrology solution's precise force control provides excellent vertical resolution, precision, and reliability measurements. This stylus profiler delivers automated step height analysis, surface contour, waviness and roughness measurements with detailed 2D or 3D analysis of topography for a variety of surfaces and materials.

SEM Sample Preparation System - TECHNOORG LINDA


The SC-1000 model is equipped both with high- and low-energy ion sources. Rapid slope cutting with the high-energy ion gun followed by gentle surface cleaning with the low-energy ion gun provides cross-sectional SEM samples suitable for semiconductor failure analysis and other analytical purposes. The system also provides an ion milling based solution for improving and cleaning of mechanically polished SEM samples and preparation of damage-free surfaces for EBSD technique. 

Remote Plasma Cleaner - PIE SCIENTIFIC

SmartClean™ technology developed by PIE Scientific combines the most advanced plasma discharge technology in nuclear research and semiconductor industry. 

EM-KLEEN and Semi-KLEEN plasma cleaners are far more advanced than previous generations of plasma cleaner. Our plasma cleaner can beat competitors on any specification. In addition, many unique features are only available on our products.


Impact of contamination to electron microscopes and other high vacuum systems


Lubricant, vacuum grease, pump oil, polymer containing samples, or untreated air can all introduce hydrocarbon contamination into vacuum systems. Low vapor pressure high molecule weight contaminants can condensate on sample surface and on chamber wall. Hydrocarbon contaminants are extremely difficult to be removed with conventional gas purging methods.



Reactive Ion Etching - OXFORD INSTRUMENTS


PlasmaPro NGP80 offers versatile plasma etch and deposition solutions on one platform with convenient open loading. This compact, small footprint system is easy to site and easy to use, with no compromise on process quality.

The PlasmaPro NGP80 is ideally suited to R&D or small-scale production, and can process from the smallest wafer pieces to 200mm wafers. The open load design allows fast wafer loading and unloading, ideal for research, prototyping and low-volume production.

Energy Dispersive Microanalysis System - EDAX


Silicon Drift Detector (SDD) for the Scanning Electron Microscope (SEM)
Apollo XL SDD Apollo X SDD
The Apollo X SDD utilizes the latest SDD technology to provide a superior EDS detector, capable of handling high count rates with excellent peak positioning and resolution stability.

Raman Spectrometer - HORIBA


The XploRA ONE™ is the highly versatile, yet easy to use, Raman microscope targeted at the industrial and routine analytical sector. It combines optical microscopy, with sensitive Raman analysis in a “ONE shot “ analysis concept. Raman has never been so easy and yet so powerful in the Analytical Lab.


The XploRA ONE™ offers simplicity in design and operation so that the analyst can focus on the sample measurements and routine analysis that is important, obtaining results not just spectra.


It provides class leading sensitivity and confocal detail, full optical microscopy and even has options for HORIBA’s innovative SWIFT™ Raman chemical imaging, yet requires minimal operator training and maintenance. The XploRA ONE™ philosophy ensures that Raman has become an even more accessible analytical technique.

Transportable Dual-band Benchtop Raman Spectrometer - BAYSPEC


BaySpec's Agility™ Raman spectrometer delivers high sensitivity and repeatability in an affordable, ruggedized, battery-operated turn-key package. Available in 532, 785, and 1064 nm with single or dual band options. An integrated sample compartment allows the utmost flexibility, via its quick-change, auto-aligning sample holders.

Hand-held  Raman Spectrometer (by B&W TEK)


The TacticID® handheld Raman spectrometer is ideal for rapid identification of unknown chemicals, explosives and narcotics directly in the field or in the lab. The TacticID® utilizes laboratory-proven Raman spectroscopy, allowing users to get real-time actionable identification of potential threats while reducing operational uncertainty and response time without ever compromising the integrity of the sample, or the chain of evidence. As a result, the TacticID® has been designed to provide the most robust identification and investigation algorithms while still maintaining ease of use by non-technical first responders. 

Advanced Magnetic Field Cancelling Solutions -  SPICER CONSULTING

The SC22 is a fourth generation Magnetic Field Cancelling System. It is a replacement for the SC12 system, which has an installed base of over 1000 units world wide. The system is dynamic, automatically responding to field changes within 100 µs andAC Line fields (50/60 Hz) are reduced by 50x. The SC22 does not cancel DC field changes from sources such as elevators, trains and traffic. The more powerful SC20 system is available to cancel both AC and DC fields. 

Vibration ControlTMC


TMC designs and manufactures advanced active and passive floor vibration cancellation systems. We continue to lead the industry with sophisticated active, inertial vibration

cancellation systems featuring piezoelectric actuators and digital controllers. Our passive products range from simple, desktop isolated microscope bases, to virtually any size optical table systems. TMC products enable ultra-precision research, measurements, and manufacturing in fields of photonics, semiconductor manufacturing, life sciences, drug discovery, and nanotechnology. 

World-Class Testing & Interconnect Products 

(POGO PINS)


A pin that electrically connects the terminal of the semiconductor device and the testing equipment's pad; is used in testing camera modules, display modules, image sensors, LCD inspecting devices, etc.

Probe Pins 


A core part of the probe card used in semiconductor wafer inspection; probes semiconductor chips using electric signals in direct contact with the semiconductor's wafer bump.

Used, Refurbished and Surplus Analytical Instruments

FIB(FOCUSED ION BEAM)

FEI FIB 200,  800,  Micrion 9500

DUALBEAM

835,  235,  Expida 1275,  865,  LEO-Zeiss... 

SEM(SCANNING ELECTRON MICROSCOPES)

Quanta 600 ESEM,  LEO 438VP,  FEI XL30...

TEM(TRANSMISSION ELECTRON MICROSCOPES)

FEI/Philips CM12,  Tecnai T20 LaB6....

SAM (Scanning Acoustic Microscope

SAM TEC ( EVOLUTION III)